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Product information
Cryostat
For X-Ray Diffraction Measurement
FEATURES
For thoroughly analyzing the structure of samples with X-ray.
With a conventional X-ray measurement device, it is only possible to measure samples at a certain temperature. With this model, it is now possible to measure samples while changing temperatures from cryogenic to ambient.
SPECIFICATIONS
| Model | CRT-A020-S700 | CRT-C020-S700 | CRT-C010-S700 |
| Coldhead/Compressor | HE05/UW404 | D510/SW115 | D105/SW112 |
| Ultimate Temperature | 4K | 12K | 12K |
| Temperature Controllable Range | 4K to 300K ±0.2K | 12K to 300K ±0.2K | 12K to 300K ±0.2K |
| Sample Dimensions | 10×10×t1 mm | ||
| Number of Samples | 1 | ||
| Accessories | Evacuation valve, Heater for temperature control, Cryogenic thermometer (for temperature control / measurement), Coldhead rotation system | ||
*It may vary depending on the operating condition.
Catalog
CRYOSTAT For X-Ray Diffraction Measurement[PDF:326KB]Inquiries about Products
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