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Product information
Cryostat
For DLTS Measurement
FEATURES
For analyzing semiconductor materials
DLTS is one of the methods to analyze impurities contained in semiconductor materials. With this model, it is possible to measure samples while freely changing the temperature of samples from cryogenic to ambient. This model can also be used for other types of electrical measurements.
DETAIL VIEW
SPECIFICATIONS
| Coldhead | HE05/UW404 | D105/SA112?SW112 |
| Ultimate Temperature | 4K | 12K |
| Temperature Controllable Range | 4K to 300K ±0.2K | 12K to 300K ±0.2K |
| Sample Dimensions | 10×10×t1 mm | |
| Number of Samples | 4 | |
| Accessories | Evacuation valve, Heater for temperature control, Cryogenic thermometer (for temperature control / measurement), Lead wire for measurement, Coaxial cable | |
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