產(chǎn)品信息
Products
產(chǎn)品信息
低溫恒溫器
For X-Ray Diffraction Measurement
特征
使用X射線全面分析樣本組織
以往的X射線測量設(shè)備只能在固定溫度下對樣本進行測定，然而本設(shè)備能夠在極低溫到室溫之間自由變化，進行測量。
標準規(guī)格
| Model | CRT-A020-S700 | CRT-C020-S700 | CRT-C010-S700 |
| Coldhead/Compressor | HE05/UW404 | D510/SW115 | D105/SW112 |
| Ultimate Temperature | 4K | 12K | 12K |
| Temperature Controllable Range | 4K to 300K ±0.2K | 12K to 300K ±0.2K | 12K to 300K ±0.2K |
| Sample Dimensions | 10×10×t1 mm | ||
| Number of Samples | 1 | ||
| Accessories | Evacuation valve, Heater for temperature control, Cryogenic thermometer (for temperature control / measurement), Coldhead rotation system | ||
*It may vary depending on the operating condition.
CRYOSTAT For X-Ray Diffraction Measurement[PDF:326KB]
